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Analysis of electronic circuits and components

Solving customer problems with advanced analysis and "analytical skills"! Introducing case studies of electronic circuit board analysis.

"Analysis of electronic substrates and components" offers surface analysis methods tailored to the customer's desired level of understanding. By utilizing various techniques, including FT-IR (reflective method and ATR method), XPS surface analysis, and AES depth analysis, we have resolved issues related to the copper surface of electronic substrate wiring patterns. 【Case Studies of Electronic Substrate Analysis (Wiring Patterns)】 ■ FT-IR (Reflective Method and ATR Method) ■ XPS Surface Analysis ■ AES Depth Analysis ■ TOF-SIMS Analysis ■ Thermal Decomposition GC/MS *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices
  • Contract Analysis

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